Test and Diagnosis for Small-Delay Defects
Description
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
Keywords
Technology & EngineeringElectronicsCircuitsComputersHardwareNanotechnology & MEMSElectricalSoftware Development & EngineeringSystems Analysis & DesignManufacturing
2011Book
Author(s)Mohammad H. Tehranipoor
PublisherSpringer New York
ISBN9781441982964
LanguageEnglish
