Advances in Pattern Recognition Joint IAPR International Workshops SSPR 2000 and SPR 2000 Alicante, Spain, August 30 - September 1, 2000 Proceedings
Description
This book constitutes the joint refereed proceedings of the 8th International Workshop on Structural and Syntactic Pattern Recognition and the 3rd International Workshop on Statistical Techniques in Pattern Recognition, SSPR 2000 and SPR 2000, held in Alicante, Spain in August/September 2000. The 52 revised full papers presented together with five invited papers and 35 posters were carefully reviewed and selected from a total of 130 submissions. The book offers topical sections on hybrid and combined methods, document image analysis, grammar and language methods, structural matching, graph-based methods, shape analysis, clustering and density estimation, object recognition, general methodology, and feature extraction and selection.
Keywords
ComputersComputer Vision & Pattern RecognitionComputer GraphicsData ProcessingIntelligence (AI) & SemanticsOptical Data ProcessingSoftware Development & Engineering
2000Book
Author(s)International Workshop on Structural and Syntactic Pattern Recognition (8th 2000 Alicante, Spain)
PublisherSpringer Science & Business Media
ISBN9783540679462
LanguageEnglish
