Atomic Force Microscopy/Scanning Tunneling Microscopy 2

Semiconductor characterization and adsorbate characterization; Scanning tunneling microscopy for very large-scale integration (VLSI) inspection; Scanning tunneling microscopy-based fabrication of nanometer scale structures; A microscopy for our time; Scanning tunneling microscopy of chemical vapor deposition diamond film: growth on highly oriented pyrolytic graphite and silicon; Scanning tunneling microscopy and atomic force microscopy of chemical-vapor=deposition diamond and diamond-like carbon thin films; Atomic resolution ultrahigh vacuum scanning tunneling microscopy of diamond (100) epitaxial films; Scanning force microscopy characterization of biopolymer films: gelatin on mica; gasification studies of graphite surface by scanning tunneling microscopy; Scanning tunneling microscopy studies of hydrocarbons adsorbed on graphite surfaces; Biological and chemical nanostructure; Visualization of the surface degradation of biomedical polymers in situ; Scanning tunneling microscopy investigations on heteroepitaxially grown overlayers of Cu-phthalocyanine on Au(111) surfaces; Characterization of poly(tetrafluoreethylene) surfaces by atomic force microscopy-results and artifactrs; Scanning probe microscopy studies of isocyanide functionalized polyaniline thin films; New developments in AFM/STM; Investigations of the topographic and spectroscopic imaging by the scanning tunneling microscopy; Observing reactions via flow injection scanning tunneling microscopy; Advances in piezoresistive cantilevers for atomic force microscopy; nanometer-scale qualitative analysis of surfaces with a modified Scanning tunneling microscope/field emission source; Atomic force microscopy imaging of single ion impacts on mica; AFM/STM in materials science; Applications of atomic force microscopy in optical fiber research; Atomic force microscopy studies on optical fiber; Scanning tunneling microscopy studies of solvent-deposited materials on highly oriented pyrolytic graphite; In situ study of stainless steel's passive layer exposed to HC1 using a Scanning tunneling microscope; Application of magnetic force microscopy in magnetic recording; Scanning electron microscopy, scanning tunneling microscopy, and atomic force microscopy; Current versus voltage characteristics for deposition and reoval of gold nanostructures on a gold surface using scanning tunneling microscopy; Atomic force microscopy of ion-beam modified carbon fibers; Index.